USPTO-SV Update on Patent Quality Metrics

USPTO-Silicon Valley Update:
Patent Quality Metrics
and Current Quality Programs

Thursday, May 11, 2017
3:00 p.m. - 4:00 p.m.
USPTO-Silicon Valley Office
26 S. Fourth Street, San Jose

Join the Silicon Valley USPTO on Thursday, May 11, 3:00-4:00 p.m., for an update on Quality metrics, current updates on quality related programs, and open discussion on quality related topics from Greg Vidovich, Associate Deputy Commissioner for Patent Quality. This update will focus on Patent Product Indicators, which includes metrics on the correctness and clarity.

More Information about Patent Quality metrics are available at: https://www.uspto.gov/patent/initiatives/quality-metrics-1.

This session is designed for patent practitioners, IP professionals, and those who would like to learn more about the patent quality and have an intermediate to advanced knowledge of the patent system.

TO REGISTER, click here. 
The event is free, but please RSVP
by Wednesday, May 10 (link is external).

Please note that the Silicon Valley USPTO is a Federal facility. Attendees are required to present a valid form of government-issued identification (driver license or passport) and may be subject to security screening.